Showing results: 181 - 195 of 696 items found.
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ScanExpress -
Corelis, Inc.
The ScanExpress Family of boundary-scan software offers a fully integrated development environment that includes boundary-scan and at-speed functional test program generation, test program execution with advanced pin level diagnostics, interactive boundary-scan debugging, and in-System Programming (ISP) of devices such as Flash memory, serial EEPROMs, CPLDd, and FPGAs.
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LXinstruments GmbH
Functional test system for testing PLC peripheral modules. The DUTs are examined with the help of the system before repair and calibrated and finally tested after repair. With the help of product-specific personality modules, the internal cabling of the system can be adapted to various test object topology without the need for a large number of matrix channels.
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Z-Axis Europe
FTFs are test fixtures which are dedicated for testing flex-based components and assemblies such as displays, touch panels and more. A weak spot in a typical functional test system is the method to connect DUT flexible cable to a circuit board where the simple method of attaching the flex directly with an ZIF or LIF connector fails.
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RAR-429 Series -
Marvin Test Solutions, Inc.
The RAR-429 module is a rugged, reliable, full featured, CompactPCI module designed to provide a stand-alone, ARINC 429 interface for avionics applications. Up to 16 ARINC429 channels are supported on a 3U CompactPCI module. The RAR-429 offers full functional test, simulation, and monitoring for ARINC 429 test and simulation applications.
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Eagle MTS180 -
Digitaltest GmbH
The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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TetraMAX® -
Synopsys, Inc.
The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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PK100x4 -
Holding Informtest
The PK100x4 AXIe module implements a 100x4 matrix switcher structure (100 inputs – 4 outputs). The module is designed to work in functional control systems, systems for monitoring and diagnostics of ground-based electronic equipment, control systems for bench tests.
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LXinstruments GmbH
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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8808A -
Fluke Corporation
The Fluke 8808A 5.5 digit multimeter dependably performs the most common measurements required by today’s applications. Whether you are performing functional tests or making critical measurements on test points, using the limit compare mode with pass/fail indicators eliminates production mistakes, especially those where results are “on the edge.
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Yokogawa Test & Measurement Corp.
For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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LXinstruments GmbH
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
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Trek5 -
Breker Verification Systems
Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Artiza Networks Inc.
The DuoSIM and DuoSIM-Advanced are the most scalable eNodeB test systems in the industry. From basic functional testing to complex C-RAN environment simulation, the DuoSIM line of testers makes validation and development of network equipment faster, easier, and more cost effective.
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APEX3910 -
AIM GmbH
STANAG3910/EFEX Test and Simulation module for PCIe with 1 dual redundant HS/LS channel and onboardFibre Optic Front End (FOFE). Easily select between EFAbus and EFEX modes for Tranche II Eurofighter. The APEX3910 is a functional replacementfor model APE3910.